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key features 5.0 v 10% read, program, and erase - minimizes system-level power requirements high performance - 55 ns access time compatible with jedec-standard commands - uses software commands, pinouts, and packages following industry standards for single power supply flash memory minimum 100,000 program/erase cycles sector erase architecture - eight equal size sectors of 64k bytes each - any combination of sectors can be erased concurrently; also supports full chip erase erase suspend/resume - suspend a sector erase operation to allow a data read or programming in a sector not being erased within the same device description the hy29f040a is a 4 megabit, 5.0 volt-only cmos flash memory device organized as a 512k bytes of 8 bits each. the device is offered in standard 32-pin pdip, 32-pin plcc and 32-pin tsop pack- ages. it is designed to be programmed and erased in-system with a 5.0 volt power-supply and can also be reprogrammed in standard prom programmers. the hy29f040a offers access times of 55 ns, 70 ns, 90 ns, 120 ns and 150 ns. the device has sepa- rate chip enable (/ce), write enable (/we) and out- put enable (/oe) controls. hyundai flash memory devices reliably store memory data even after 100,000 program/erase cycles. the hy29f040a is entirely pin and command set compatible with the jedec standard for 4 mega- bit flash memory devices. the commands are writ- ten to the command register using standard micropro- cessor write timings. register contents serve as input to an internal state-machine which controls the erase and programming circuitry. write cycles also internally latch addresses and data needed for the programming and erase operations. internal erase algorithms - automatically erases a sector, any combination of sectors, or the entire chip internal programming algorithms - automatically programs and verifies data at a specified address. low power consumption - 40 ma maximum active read current - 60 ma maximum program/erase current -5 m a maximum standby current sector protection - hardware method disables any combination of sectors from a program or erase operation this document is a general product description and is subject to change without notice. hyundai electronics does not assume any responsibility for use of circuits described. no patent licences are implied. rev.03/aug.97 hyundai semiconductor the hy29f040a is programmed by executing the program command sequence. this will start the internal byte programming algorithm that automatically times the program pulse width and also verifies the proper cell margin. erase is accomplished by executing either sector erase or chip erase command sequence. this will start the internal erasing algorithm that automatically times the erase pulse width and also verifies the proper cell margin. no preprogramming is required prior to execution of the internal erase algorithm. sectors of the hy29f040a flash memory array are electri- cally erased via fowler-nordheim tunneling. bytes are programmed one byte at a time using a hot electron injection mechanism. the hy29f040a features a sector erase architecture. the device memory array is divided into 8 sectors of 64k bytes each. the sectors can be erased indi- vidually or in groups without affecting the data in other sectors. the multiple sector erase and full chip erase capabilities add flexibility to altering the data in the device. to protect data in the device from accidental program and erase, the device also has a sector protect function. this function hardware write protects the selected sectors. the sector hy29f040a series 512k x 8-bit cmos 5.0 volt-only, sector erase flash memory
2 hy29f040a protect and sector unprotect features can be en- abled in a prom programmer. the hy29f040a needs a single 5.0 volt power- supply for read, program and erase operation. in- ternally generated and well regulated voltages are provided for program and erase operation. a low vcc detector inhibits write operations on loss of power. end of program or erase is detec ted by /data polling of dq7 or by the toggle bit feature on dq6. once program or erase cycle is successfully com- pleted, the device internally resets to the read mode. block diagram e rase voltage generator pgm voltage generator timer vcc d etector cell m atrix vcc vss ce oe a0-a18 dq0-dq7 stb we y-gating stb input/output b uffers state c ontrol com mand register chip enable output e nable logic address latch y-d ecoder x-d ecoder data latch
3 hy29f040a pin description pin name pin function a0 - a18 address inputs dq0 - dq7 data input/output /ce chip enable /oe output enable /we write enable vss device ground vcc device power supply (5.0v 10 % for -70, -90, -120 and -150) (5.0v 5 % for -55) pin connection oe a1 0 ce dq 7 dq 6 dq 5 dq 4 dq 3 vss dq 2 dq 1 dq 0 a0 a1 a2 a3 a1 1 a9 a8 a1 3 a1 4 a1 7 we vcc a1 8 a1 6 a1 5 a1 2 a7 a6 a5 a4 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 a1 1 a9 a8 a1 3 a1 4 a1 7 we vcc a1 8 a1 6 a1 5 a1 2 a7 a6 a5 a4 oe a1 0 ce dq 7 dq 6 dq 5 dq 4 dq 3 vss dq 2 dq 1 dq 0 a0 a1 a2 a3 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 vcc we a1 7 a1 4 a1 3 a8 a9 a1 1 oe a1 0 ce dq 7 dq 6 dq 5 dq 4 dq 3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 a1 8 a1 6 a1 5 a1 2 a7 a6 a5 a4 a3 a2 a1 a0 dq 0 dq 1 dq 2 vss a7 a6 a5 a4 a3 a2 a1 a0 dq0 a14 a13 a8 a9 a11 oe a10 ce dq7 dq1 dq2 vss dq3 dq4 dq5 dq6 a12 a15 a16 a18 vcc we a17 4 3 2 1 32 31 30 14 15 16 17 18 19 20 5 6 7 8 9 10 11 12 13 29 28 27 26 25 24 23 22 21 standard tsop pdip plcc reverse tsop
4 hy29f040a bus operation table 1. bus operations (1) operation /ce /oe /we a0 a1 a6 a9 i/o electronic id manufacturer code (2) ll h l l lv id code electronic id device code (2) ll h hl lv id code read (3) l l h a0a1 a6a9 d out standby h x x x x x x high z output disable l h h x x x x high z write l h l a0 a1 a6 a9 d in (4) enable sector protect l v id lxxxv id x verify sector protect l l h l h l v id code notes: 1. l = v il , h = v ih , x = dont care. see dc characteristics for voltage levels. 2. manufacturer and device codes may also be accessed via a command register sequence. refer to table 4. 3. /we can be v il if /ce is v il , /oe at v ih initiates the write operations. 4. refer to table 4 for valid d in during a write operation. table 2. sector protection verify electronic id codes type a18 a17 a16 a6 a1 a0 code dq7 dq6 dq5 dq4 dq3 dq2 dq1 dq0 hex manufacture code x x x v il v il v il adh10101101 hy29f040a device code x x x v il v il v ih a4h10100100 sector protection sector addresses v il v ih v il 01h (1) 00000001 notes: 1. outputs 01h at protected sector addresses, and output 00h at unprotected sector addresses.
5 hy29f040a read mode the hy29f040a has three control functions which must be satisfied to obtain data at the outputs. / ce is the power control and should be used for device selection. /oe is the output control and should be used to gate data to the output pins if a device is selected. as shown in table 1, /we should be held at v ih , except in write mode and enable sector protect mode. address access time (t acc ) is equal to the delay from stable addresses to valid output data. the chip enable access time (t ce ) is the delay from stable addresses and stable /ce to valid data at the output pins. the output enable access time is the delay from the falling edge of /oe to valid data at the output pins (assuming the addresses have been stable for at least t acc -t oe time). standby mode the hy29f040a has two standby modes: a cmos standby mode (/ce input held at vcc 0.5v), when current consumed is typically less than 1 m a; and a ttl standby mode (/ce is held at v ih ) when the typical current required is reduced to 1 ma. in standby mode, outputs are in a high impedance state, independent of /oe input. if the device is deselected during programming or erase, the device will draw active current until the programming or erase operation is completed. a18 a17 a16 address range sa0 0 0 0 00000h - 0ffffh sa1 0 0 1 10000h - 1ffffh sa2 0 1 0 20000h - 2ffffh sa3 0 1 1 30000h - 3ffffh sa4 1 0 0 40000h - 4ffffh sa5 1 0 1 50000h - 5ffffh sa6 1 1 0 60000h - 6ffffh sa7 1 1 1 70000h - 7ffffh table 3. sector addresses electronic id mode the electronic id mode allows the reading out of a binary code from the device and will identify its manufacturer and device type. this mode is in- tended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. this mode is functional over the entire temperature range of the device. to activate this mode, the programming equipment must force v id (11.5v to 12.5v) on address pin a9. two identifier bytes may then be sequenced from the device outputs by toggling address a0 from v il to v ih . all addresses are dont cares ex- cept a0, a1, a6, and a9. the manufacturer and device codes may also be read via the command register, (i.e., when hy29f040a is erased or programmed in a system without access to high voltage on the a9 pin). the command sequence is illustrated in t able 4 (refer to electronic id command section). byte 0 (a0=v il ) represents the manufacturers code (hyundai electronics=adh) and byte 1 (a0=v ih ) the device identifier code (hy29f040a=a4h). these two bytes are given in table 2. all identifi- ers for manufacturer and devices will exhibit odd parity with the msb (dq7) defined as the parity bit. to permit reading of the proper device codes when executing the electronic id, a1 must be v il (see table 2).
6 hy29f040a output disable mode with the /oe input at a logic high level (v ih ), output from the device is disabled. this will cause the output pins to be in a high impedance state. it is shown in table 1 that /ce = v il and /we = v ih for output disable. this is to differentiate output dis- able mode from write mode and to prevent inadvertant writes during output disable. write mode device programming and erase are accomplished via the command register. the contents of the reg- ister serve as inputs to the internal state machine. outputs of the state machine dictate the function of the device. the command register itself does not occupy any addressable memory locations. the register is a latch used to store the commands along with the addresses and data information needed to execute the command. the command register is written by bringing /we to v il , while /ce is at v il and /oe is at v ih . addresses are latched on the falling edge of /we or /ce, whichever happens later, while data is latched on the rising edge of /we or /ce, which- ever happens first. standard microprocessor write timings are used. refer to ac characteris- tics for programming/erase and their respective timing waveforms for specific timing parameters. enable sector protect and verify sector protect modes the hy29f040a has a hardware sector protect mode that disables both programming and erase operation to protected sectors. in this device there are 8 sectors of 64k bytes each. the sector protect feature is enabled using programming equipment at the users site. the device is shipped from hyundais factory with all sectors unprotected. to activate the sector protect mode, the user must force v id on address pin a9 and control pin / oe. the sector addresses (a18, a17 and a16) should be set to the sector to be protected (see table 3 for the sector address for each of the eight individual sectors). programming of the protec- tion circuitry starts on the falling edge of /we pulse and is terminated with the rising edge of /we. sector addresses must be held fixed during the /we pulse. to verify programming of the protection circuitry, the programming equipment must force v id on the address pin a9 with /ce and /oe at v il and /we at v ih . as shown in table 2, scanning the sector addresses (a18, a17 and a16) while (a6, a1 and a0) = (0, 1, 0) will produce a 01h code at the device output pins for a protected sector. in the verify sector protect mode, the device will read 00h for an unprotected sector. in this mode, the lower order addresses, except for a0, a1 and a6, are dont care. address locations with a1 = v il are reserved for electronic id manufacturer and de- vice codes. it is also possible to determine if a sector is protected in-system by writing the elec- tronic id command (described in the electronic id command section below).
7 hy29f040a command definitions device operations are selected by writing specific address and data sequences into the command register. writing incorrect addresses and data values or writing them in the improper table 4. command definitions (1,2,3,4) bus first bus second bus third bus fourth bus fifth bus sixth bus command write write cycle write cycle write cycle write cycle write cycle write cycle sequence cycles req'd addr data addr data addr data addr data addr data addr data read/reset 1 xxxh f0h ra rd read/reset 4 5555h aah 2aaah 55h 5555h f0h ra rd electronic id 4 5555h aah 2aaah 55h 5555h 90h xx00h adh xx01h a4h byte program 4 5555h aah 2aaah 55h 5555h a0h pa pd chip erase 6 5555h aah 2aaah 55h 5555h 80h 5555h aah 2aaah 55h 5555h 10h sector erase 6 5555h aah 2aaah 55h 5555h 80h 5555h aah 2aaah 55h sa 30h erase suspend 1 xxxh b0h erase resume 1 xxxh 30h notes: 1. bus operations are defined in table 1. 2. for a command sequence, address bits a15, a14, a13, a12, and a11 = x = dont care. address bits a18, a17, a16, and a15 = x = dont care for all address commands except for program address(pa) and sector address(sa). in the case of sector address, address bit a15 = x = dont care for all addresses except for program address (pa) and sector addresses (sa). 3. ra = address of the memory location to be read. rd = data read from location ra during read operation. pa = address of the memory location to be programmed. addresses are latched on the falling edge of the /we pulse. pd = data to be programmed at location pa. data is latched on the falling edge of /we. sa = address of the sector to be erased (see table 3). 4. the erase suspend (b0h) and erase resume (30h) commands are valid only while the sector erase opera tion is in progress. sequence will reset the device to read mode. table 4 defines the valid register command sequences. either read/reset command will reset the device (when applicable).
8 hy29f040a the falling edge of /ce or /we, whichever hap- pens later, and program data (pd) is latched on the rising edge of /ce or /we, whichever happens first. the rising edge of /ce or /we, whichever happens first, begins byte programming. upon executing the byte programming command sequence, the devices internal state machine ex- ecutes an internal byte programming algorithm. the system is not required to provide further con- trols or timings. the device will automatically pro- vide adequate internally generated program pulses and verify the programmed cell margin of the byte. during byte programming operation, data bit dq7 shows the complement of the program data. this operation is known as /data polling. the internal byte programming algorithm has completed its operation when the data on dq7 is equivalent to the last data written to this bit (see write operation status section). at the completion of the byte pro- gramming algorithm, the device returns to the read mode. at this time, the address pins are no longer latched. therefore, the system must supply the last program address at the completion of the byte pro- gramming operation to read the correct program data on dq7. byte programming is allowed in any sequence, and across sector boundaries. however, remember that a data 0 cannot be programmed to a data 1". only erase operations can convert a logical 0" to a logical 1. attempting to program data from 0 to 1 may cause the device to exceed time limits, or even worse, result in an apparent success accord- ing to the /data polling algorithm. in the later case, however, a subsequent read of this bit will show that the data is still a logical 0. figure 1 illustrates the byte programming algorithm using typical command strings and bus operations. chip erase command chip erase is a six bus cycle operation (see table 4). chip erase begins on the rising edge of the last / we pulse in the command sequence. there are two 'unlock' write cycles. these are followed by read/reset command the read or reset operation is initiated by writing the read/reset command sequence in to the com- mand register. microprocessor read cycles retrieve the data from the memory. the device remains enabled for reads until the command register con- tents are changed. the device will automatically power-up in the read/ reset mode. in this case, a command sequence is not needed to read the memory data. this de- fault power-up to read mode ensures that no spu- rious changes of the data can take place during the power transitions. refer to the ac character- istics for read-only operation and the respective timing waveforms for the specific timing param- eters. electronic id command the hy29f040a contains an electronic id com- mand to supplement the traditional prom programming method described in the electronic id mode section. the operation is initiated by writing the electronic id command sequence into the command register. following the command write, a read cycle from address xx00h retrieves manufacturer code of adh. a read cycle from ad- dress xx01h returns the device code a4h (see table 2). all manufacturer and device codes will exhibit odd parity with the msb (dq7) defined as the parity bit. the electronic id command can also be used to identify protected sectors. after writing the electronic id command sequence, the cpu can scan the sector addresses (a18, a17, a16) while (a6, a1, a0) = (0, 1, 0). protected sectors will return 01h on the data outputs and unprotected sectors will return 00h. to terminate the operation, it is necessary to write the read/reset command sequence into the command register. byte programming command the hy29f040a is programmed one byte at a time. programming is a four bus cycle operation (see table 4). the program address (pa) is latched on
9 hy29f040a writing the "set-up" command. two more 'unlock' write cycles are then followed by the chip erase command. upon executing the chip erase command sequence, the devices internal state machine executes an internal erase algorithm. the system is not required to provide further controls or timings. the device will automatically provide adequate in- ternally generated erase pulses and verify chip erase within the proper cell margins. during chip erase, all sectors of the device are erased except protected sectors. during chip erase, data bit dq7 shows a logical 0. this operation is known as /data polling. the erase operation is completed when the data on dq7 is a logical 1 (see write operation status sec- tion). upon completion of the chip erase operation, the device returns to read mode. at this time, the address pins are no longer latched. note that /data polling must be performed at a sector address within any of the sectors being erased and not a protected sector to ensure that dq7 returns a logical 1 upon completion of the chip erase operation. figure 2 illustrates the chip erase algorithm using typical command strings and bus opera tions. the device will ignore any commands written to the chip during execution of the internal chip erase algorithm. sector erase command sector erase is a six bus cycle operation (see table 5). there are two 'unlock' write cycles that are fol- lowed by writing the "set-up" command. two more "unlock" write cycles are then followed by the sec- tor erase command. the sector address (any ad- dress location within the desired sector) is latched on the falling edge of /we, while the command data is latched on the rising edge of /we. an internal de- vice timer initiates sector erase operation after 100 m s 20% (80 m s to 120 m s) from the rising edge of the /we pulse for the last sector erase command entered on the device. upon executing the sector erase command sequence, the devices internal state machine executes an internal erase algorithm. the system is not required to provide further controls or timings. the device will automatically provide adequate internally generated erase pulses and verify sector erase within the proper cell margins. protected sectors of the device will not be erased, even if they are selected with the sector erase command. multiple sectors can be erased sequentially by writ- ing the sixth bus cycle command of the sector erase command for each sector to be erased. the time between initiation of the next sector erase com- mand must be less than 80 m s to guar antee ac- ceptance of the command by the internal state ma- chine. the time-out window can be monitored via the write operation status pin dq3 (refer to the write operation status section for sector erase timer operation). it is recommended that cpu interrupts be disabled during this time to ensure that the sub- sequent sector erase commands can be initiated within the 80 m s window. the interrupts can be re- enabled after the last sector erase command is written. as mentioned above, an internal device timer will initiate the sector erase operation 100 m s 20% (80 m s to 120 m s) from the rising edge of the last / we pulse. the sector erase timer write operation status pin (dq3) can be used to monitor the time out window. if another falling edge of the /we occurs within the 100 m s time-out window, the internal de- vice timer is reset. loading the sector erase buffer may be done in any sequence and with any num- ber of sectors. any command other than sector erase or erase suspend or erase resume during this period and afterwards will reset the device to read mode, ig- noring the previous command string. resetting the device after it has begun execution of a sector erase operation will result in the data in the oper- ated sectors being undefined. in this case, restart the sector erase operation on those sectors and allow them to complete the erase operation. when erasing a sector or multiple sectors, the data in the unselected sectors remains unaffected. the system is not required to provide any controls or timings during these operations.
10 hy29f040a during sector erase operation, data bit dq7 shows a logical 0. this operation is known as /data polling. sector erase operation is complete when data on dq7 is a logical 1 (see write opera- tion status section) at which time the device returns to read mode. at this time, the address pins are no longer latched. note that /data polling must be performed at a sector address within any of the sectors being erased and not a protected sector to ensure that dq7 returns a logical 1 upon completion of the sector erase operation. figure 2 illustrates the sector erase algorithm us- ing typical command strings and bus operations. during execution of the sector erase command, only the erase suspend and erase resume com- mands are allowed. all other commands will reset the device to read mode. note: do not attempt to write an invalid command sequence during the sector erase operation. doing so will terminate the sector erase operation and the device will reset to the read mode. erase suspend/erase resume commands the erase suspend command allows the user to interrupt a sector erase operation and read data from or program to a sector that is not being erased. the erase suspend command onthe hy29f040 also allows for byte programming during the suspended erase from a sector not being erased. the erase suspend command is applicable only during sector erase operation and will be ignored if written during the chip erase operation or byte programming op- eration. the erase suspend command (b0h) will be allowed only during the sector erase opera- tion, including, but not limited to, the sector erase time-out period after any sector erase commands (30h) have been initiated. writing the erase suspend command during the time-out will result in immediate termination of the time-out period. any subsequent writes of the sec- tor erase command will be taken as the erase resume command (30h). note that any other com- mands during the time-out will reset the device to the read mode. the address pins are dont-cares when writing the erase suspend or erase resume commands. when the erase suspend command is written dur- ing a sector erase operation, the chip will take a maximum of 15 m s to suspend the erase opera- tion and go into erase suspended-read mode. during this time, the system can monitor the /data polling or toggle bit write operation status flags to determine when the device has entered erase sus- pend-read mode (see write operation status sec- tion). the system must use an address of an eras- ing sector to monitor /data polling or toggle bit to determine if the sector erase operation has been suspended. in the erase suspend-read mode, the system can read data from any sector that is not being erased. a read from a sector being erased may result in invalid data. after the system writes the erase suspend com- mand and waits until the toggle bit stops toggling, data reads from the device may then be performed. any further writes of the erase suspend command at this time will be ignored. to resume operation of sector erase, the erase resume command (30h) should be written. any further writes of the erase resume command at this point will be ignored. another erase suspend command can be written after the chip has re- sumed the sector erase operation.
11 hy29f040a dq7 /data polling the hy29f040a device features /data polling as a method to indicate to the host the status of the byte programming, chip erase, and sector erase operations. when the byte programming opera- tion is in progress, an attempt to read the device will produce the compliment of the data last writ- ten to dq7. upon completion of the byte program- ming operation, an attempt to read the device will produce the true data last written to dq7. when the chip erase or sector erase operation is in progress, an attempt to read the device will produce a logical 0 at the dq7 output. upon completion of the chip erase or sector erase operation, an at- tempt to read the device will produce a logical 1" at the dq7 output. the flowchart for /data polling (dq7) is shown in figure 3. for chip erase, the /data polling is valid after the rising edge of the sixth /we pulse in the six write pulse sequence. for sector erase, the /data poll- ing is valid after the last rising edge of the sector erase /we pulse. for both chip erase and sec- tor erase, /data polling must be performed at sec- tor address within any of the sectors being erased and not a protected sector. otherwise, the /data polling status may not be valid. once the internal algorithm operation is close to being completed, the hy29f040a data pins (dq7) may change asyn- chronously while the output enable (/oe) is as- serted low. this means that the device is driving sta- tus information on dq7 at one instant of time and valid data at the next instant of time. depending on when the system samples the dq7 output, it may read the status or valid data. even if the device has completed the internal algorithm operation and dq7 has a valid data, data outputs on dq0-dq6 may be still invalid. v alid data on dq0-dq7 will be read on successive read attempts. the data polling feature is only active during the byte programming operation, chip erase operation, sector erase operation, or sector erase time-out window (see table 5). dq6 toggle bit the hy29f040a also features the toggle bit as a method to indicate to the host system the status of the internal programming and erase algorithms. the flowchart for toggle bit (dq6) is shown in figure 4. during an internal programming or erase algorithm cycle, successive attempts to read (/oe toggling) data from the device will result in dq6 toggling between one and zero. once the internal pro- gramming or erase operation is completed, dq6 will stop toggling and valid data will be read on the write operation status notes : 1. dq0, dq1, dq2, dq4 are reserve pins for future use. table 5. write operation status flags (1) status dq7 dq6 dq5 dq3 byte programming operation /dq7 toggle 0 0 in progress chip or sector erase operation 0 t oggle 0 1 erase suspend erase suspended sector 1 no t oggle 0 n/a mode non-erase suspended sector data data data data exceeded byte programming operation /dq7 toggle 1 0 time limits chip or sector erase operation 0 t oggle 1 1 program in erase suspend mode /dq7 toggle 1 1
12 hy29f040a next successive attempts. during byte programming, the toggle bit is valid after the rising edge of the fourth /we pulse in the four write pulse sequence. for chip erase, the toggle bit is valid after the rising edge of the sixth /we pulse in the six write pulse sequence. for sector erase, the toggle bit is valid after the last rising edge of the sector erase /we pulse. the toggle bit is also active during the sector erase time-out win- dow. in byte programming, if the sector being written to is protected, the toggle bit toggles for about 2 m s and then stops toggling without the data having ch anged. in chip erase or sector erase, the device will erase all the selected sectors except for the ones that are protected. if all selected sectors are pro- tected, the chip will toggle the toggle bit for about 100 m s and then drop back into read mode, having changed none of the data. either /ce or /oe tog- gling will cause the dq6 toggle bit to toggle. dq5 exceeded timing limits dq5 will indicate if byte programming, chip erase, or sector erase time has exceeded the sp ecified limits (internal pulse count) of the device. under these conditions dq5 will produce a logical 1. this is a failure condition that indicates the program or erase cycle was not successfully completed. /data poll- ing is the only operating function of the device under this condition. the /oe and /we pins will control output disable functions as described in table 1. if this failure condition occurs during sector erase operation, it indicates a particular sector is bad and it may not be reused. however, other sectors are still functional and may continue to be used for the program or erase operation. to use other sectors of the device, it must be reset to read mode. write the read/reset command sequence to the device, and then execute the byte program- ming or sector erase command sequence. this allows the system to continue to use the other active sectors in the device. if this failure condition occurs during the chip erase operation, it indicates the entire chip is bad or combination of sectors are bad. in this situa- tion, the chip should not be reused. if this failure condition occurs during the byte pro- gramming operation, it indicates the entire sector containing that byte is bad and this sector may not be reused (other sectors are still functional and can be reused). the dq5 failure condition may also appear if a user tries to program a non-blank location without erasing. in this example, the device may exceed time limits and not complete the internal algorithm op- eration. hence, the system never reads valid data on dq7 bit, and dq6 never stops toggling. once the device has exceeded timing limits, the dq5 bit will indicate a 1. dq3 sector erase timer after the completion of the initial sector erase com- mand sequence, the sector erase time-out win- dow will begin. dq3 will remain low until the time- out window is closed. /data polling and toggle bit are valid after the initial sector erase command sequence. if /data polling or the toggle bit indicates the de- vice has been written with a valid erase command, dq3 may be used to determine if the sector erase time-out window is still open. if dq3 is a logical 1, the internally controlled erase cycle has begun. attempts to write subsequent com- mand to the device will be ignored until the erase operation is completed as indicated by /data poll- ing or toggle bit. if dq3 is a logical 0", the device will accept additional sector erase commands. to insure the command has been accepted, the system software should check the status of dq3 prior to and following each subsequent sector erase command. if dq3 were high on the second status check, the command may not have been accepted. refer to table 5: write operation sta- tus flags.
13 hy29f040a data protection the hy29f040a is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transitions. during power-up the device automatically resets the internal state ma- chine in the read mode. also, with its control reg- ister architecture, alteration of the memory con- tents only occurs after successful completion of spe- cific multi-bus cycle command sequences. the device also incorporates several features to pre- vent inadvertent write cycles resulting from vcc power-up and power-down transitions or system noise. low vcc write inhibit to avoid initiation of a write cycle during vcc power- up and power-down, a write cycle is locked out for vcc less than 3.2v (typically 3.7v). if vcc < v lko , the command register is disabled and all internal programming/erase circuits are disabled. under this condition the device will reset to the read mode. subsequent writes will be ignored until the vcc level is greater than v lko . it is the users re- sponsibility to ensure that the control pins are logi- cally correct to prevent unintentional writes when vcc is above 3.2v. write pulse glitch protection noise pulses of less than 5 ns (typical) on /oe, /ce or /we will not initiate a write cycle. logical inhibit writing is inhibited by holding any one of /oe = v il , /ce = v ih , or /we = v ih . to initiate a write cycle /ce and /we must be a logical 0 while /oe is a logical 1. power-up write inhibit power-up of the device with /we = /ce = v il and /oe = v ih will not accept commands on the rising edge of /we. the internal state machine is automatically reset to read mode on power-up. sector protection sectors of the hy29f040a may be hardware protected at the users factory. the protection circuitry will disable both program and erase functions for the protected sectors. requests to program or erase a protected sector will be ignored by the device. sector protection is accomplished in a prom programmer. the hy29f040a features hardware sector protec- tion that will disable both program and erase operations to an individual sector or any group of sectors. to activate this mode, programming equipment must force v id on control pin /oe and address pin a9. sector addresses should be set using higher address lines a18, a17 and a16. the protection mechanism begins on the falling edge of the /we pulse and is terminated with the rising edge of /we. see figures 13 and 14 for details of implementing sector protect. sector unprotect the hy29f040a also features a sector unprotect mode, so that a protected sector may be unpro- tected to incorporate any changes in the code. protecting all sectors is necessary before unprotecting any sector(s). sector unprotection is accomplished in a prom programmer. see fig- ures 15 and 16 for details of implementing sector unprotect.
14 hy29f040a figure 1. internal programming algorithm start /data polling device programming completed last address ? 5555h/aah 2aa ah/55h 5555h/a0h program command sequence (address/command) no yes write program command sequence (see below) increment address program address/program data
15 hy29f040a figure 2. internal erase algorithm start write erase com mand sequence (see below) /data polling or toggle bit successfully completed erase completed 5555h/aah 2aaah/55h 5555h/80h 5555h/aah 2aaah/55h 5555h/10h chip erase command sequence (address/command) individual sector/multiple sector erase command sequence (address/command) additional sector erase com mands are optional 5555h/aah 2aaah/55h 5555h/80h 5555h/aah 2aaah/55h sector address/30h sector address/30h sector address/30h
16 hy29f040a read byte (dq0-dq7), addr = va start read byte (dq0-dq7), addr = va dq7 = data ? dq5 = 1 ? dq7 = data ? fail yes pass no no yes yes no va = byte address for programming = any of the sector addresses within the sector being erased during sector erase operation. = xxxxh during chip erase notes: 1. dq7 is rechecked even if dq5 = logical 1 because dq7 may change simultaneously with dq5. figure 3. /data polling algorithm
17 hy29f040a read byte (dq0-dq7) start read byte (dq0-dq7) dq6 = toggle ? dq5 = 1 ? dq6 = toggle ? fail no pass no yes yes no yes notes: 1. dq6 is rechecked even if dq5 = logical 1 because dq6 may stop toggling at the same time as dq5 changing to a logical 1". figure 4. toggle bit algorithm
18 hy29f040a absolute maximum ratings storage temperature plastic package .............................. -65c to + 125c ambient temperature with power applied .......................... -55c to + 125c voltage with respect to ground all pins except a9 (1) .......................... -2.0v to + 7.0v vcc (1) ............................................... -2.0v to + 7.0v a9 (2) ............................................... -2.0v to + 14.0v output short circuit current (3) ......................... 200 ma notes: 1. minimum dc voltage on input or i/o pins is - 0.5v. during voltage transitions, inputs may overshoot vss to -2.0v for periods of up to 20 ns. maximum dc voltage on output and i/o pins is vcc + 0.5v. during voltage transitions, outputs may overshoot to vcc + 2.0v for periods up to 20 ns. 2. minimum dc input voltage on a9 pin is -0.5v. during voltage transitions, a9 may overshoot vss to -2.0v for periods of up to 20 ns. maximum dc input voltage on a9 is + 13.5v which may overshoot to 14.0v for periods of up to 20 ns. 3. no more than one output shorted at a time. duration of the short circuit should not be greater than one second. operating ranges commercial( c) devices ..................... 0c to + 70c industrial (i) devices ........................ -40c to + 85c extended (e) devices ..................... -55c to + 125c vcc supply voltages ................................................. vcc for hy29f040a-55 .................. + 4.75v to + 5.25v vcc for hy29f040a-70, -90, -120, -150 .......................................................... + 4.5v to + 5.5v stresses above those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. exposure of the device to absolute maxi- mum rating conditions for extended periods may affect device reliability. notes: 1. operating ranges define those limits between which the functionality of the device is guaranteed.
19 hy29f040a figure 5. maximum negative overshoot waveform 20 ns 20 ns 20 ns v cc + 2.0 v v cc + 0.5 v 2.0 v figure 6. maximum positive overshoot waveform 20 ns 20 ns 20 ns - 2.0 v +0.8 v -0.5 v
20 hy29f040a dc characteristics ttl/nmos compatible parameter symbol parameter description t est conditions min. max. unit i li input load current v in = vss to vcc, vcc = vcc max. 1.0 m a i lit a9 input load current vcc = vcc max., a9 = v id 50 m a i lo output leakage current v out = vss to vcc, vcc = vcc max. 1.0 m a i cc1 vcc active current (1) /ce = v il , /oe = v ih 40 ma i cc2 vcc active current (2,3) /ce = v il , /oe = v ih 60 ma i cc3 vcc standby current vcc = vcc max., /ce = v ih 1.0 ma v il input low level -0.5 0.8 v v ih input high level 2.0 vcc + 0.5 v v id voltage for electronic id and sector protect vcc = 5.0 v 11.5 12.5 v v ol output low voltage i ol = 12 ma, vcc = vcc min. 0.45 v v oh output high voltage i oh = -2.5 ma, vcc = vcc min. 2.4 v v lko low vcc lock-out voltage 3.2 4.2 v notes: 1. the icc current listed includes both the dc operating current and the frequency dependent component (at 6 mhz). the frequency component typically is less than 1 ma/mhz, with /oe at v ih . 2. icc active while internal algorithm (program or erase) is in progress. 3. not 100% tested.
21 hy29f040a cmos compatible parameter symbol parameter description t est conditions min. max. unit i li input load current v in = vss to vcc, vcc = vcc max. 1.0 m a i lit a9 input load current vcc = vcc max., a9 = v id 50 m a i lo output leakage current v out = vss to vcc, vcc = vcc max. 1.0 m a i cc1 vcc active current (1) /ce = v il , /oe = v ih 40 ma i cc2 vcc active current (2,3) /ce = v il , /oe = v ih 60 ma i cc3 vcc standby current vcc = vcc max., /ce = vcc 0.5v 5.0 m a v il input low level -0.5 0.8 v v ih input high level 0.7x vcc vcc + 0.3 v v id voltage for electronic id and sector protect vcc = 5.0 v 11.5 12.5 v v ol output low voltage i ol = 12 ma, vcc = vcc min. 0.45 v v oh1 output high voltage i oh = -2.5 ma, vcc = vcc min. 0.85x v vcc v oh2 i oh = -100 m a, vcc = vcc min. vcc v -0.4 v lko low vcc lock-out voltage 3.2 4.2 v notes: 1. the icc current listed includes both the dc operating current and the frequency dependent component (at 6 mhz). the frequency component typically is less than 1 ma/mhz, with /oe at v ih . 2. icc active while internal algorithm (program or erase) is in progress. 3. not 100% tested. dc characteristics (continued)
22 hy29f040a ac characteristics read only operations parameter symbol description t est setup -55 (1) -70 (2) -90 (2) -120 (2) - 150 (2) unit jedec standard t avav t rc read cycle time (3) min. 55 70 90 120 150 n s t avqv t acc address to /ce = v il max. 5 5 7 0 9 0 1 2 0 1 5 0 n s output delay /oe = v il t elqv t ce chip enable to /oe = v il max. 5 5 7 0 9 0 1 2 0 1 5 0 n s output delay t glqv t oe output enable to max. 2 5 3 0 3 5 5 0 5 5 n s output delay t ehqz t hz chip enable to max. 1 8 2 0 2 0 3 0 3 5 n s output high z (3,4) t ghqz t df output enable to 18 20 20 30 35 n s output high z (3,4) t axqx t oh output hold time min. 0 0 0 0 0 n s from addresses, /ce or /oe, whichever occurs first notes: 1. test conditions: 2. test conditions: 3. output driver disable time. output load: 1 ttl gate and 30 pf output load: 1 ttl gate and 100 pf 4. not 100% tested. input rise and fall times: 5 ns input rise and fall times: 20 ns input pulse levels: 0.0 v to 3.0 v input pulse levels: 0.45 v to 2.4 v timing measurement reference level timing measurement reference level input: 1.5 v input: 0.8 and 2.0 v output: 1.5 v output: 0.8 and 2.0 v
23 hy29f040a figure 7. test condition notes: 1. for -55: cl = 30pf including jig capacitance. 2. for all others: cl = 100pf including jig capacitance. 5.0 v 6.2 kohm 2.7 kohm device under test in3064 or equivalent c l diodes = in3064 or equivalent
24 hy29f040a ac characteristics programming/erase operations parameter symbols jedec standard description -55 -70 -90 -120 -150 unit t avav t wc write cycle time (1) min. 55 70 90 120 150 n s t avwl t as address setup time min. 0 0 0 0 0 n s t wlax t ah address hold time min. 40 45 45 50 50 n s t dvwh t ds data setup time min. 25 30 45 50 50 n s t whdx t dh data hold time min. 0 0 0 0 0 n s t oes output enable setup time min. 0 0 0 0 0 n s t oeh output read (1) min. 0 0 0 0 0 n s enable toggle bit & min. 10 10 10 10 10 n s hold time /data polling (1) t ghwl t ghwl read recover time before write min. 0 0 0 0 0 n s t elwl t cs /ce setup time min. 0 0 0 0 0 n s t wheh t ch /ce hold time min. 0 0 0 0 0 n s t wlwh t wp write pulse width min. 30 35 45 50 50 n s t whwl t wph write pulse width high min. 20 20 20 20 20 n s t whwh1 t whwh1 byte programming operation typ. 7 7 7 7 7 m s max. 1.0 1.0 1.0 1.0 1.0 m s t whwh2 t whwh2 sector erase operation typ. 1.0 1.0 1.0 1.0 1.0 sec max. 1 5 1 5 1 5 1 5 1 5 s e c t whwh3 t whwh3 chip erase operation typ. 8 8 8 8 8 sec max. 1 2 0 1 2 0 1 2 0 1 2 0 1 2 0 s e c t vcs vcc setup time (1) min. 50 50 50 50 50 m s t vidr rise time to v id (1,2) min. 500 500 500 500 500 n s t oesp /oe setup time to /we active (1,2) min. 4 4 4 4 4 m s t vlht voltage transition time (1,2) min. 4 4 4 4 4 m s t wpp1 sector protect write pulse width (2) min. 100 100 100 100 100 m s t wpp2 sector unprotect write pulse width (2) min. 10 10 10 10 10 m s t csp /ce setup time to /we active (1, 2) min. 4 4 4 4 4 n s notes: 1. not 100% tested. 2. these timings are for sector protect and/or sector unprotect operations.
25 hy29f040a switching waveforms figure 8. ac waveforms for read operations addresses t rc address stable ce oe we outputs t ce t oe t hz t acc t oh output valid high z t df high z t oeh must be steady will be steady waveform inputs outputs may chan g e will be chan g in g from h to l from h to l may chan g e will be chan g in g from l to h from l to h dont care, chan g in g , state any chan g e unknown permitted does not center line is apply hi g h impedance off state
26 hy29f040a switching waveforms data polling addresses ce oe we data 5.0v 5555h pa pa t wc t as t ah t ghwl t wp t cs t wph t ds t dh a0h pd t whwh1 dq7 d out gnd v cc notes: 1. pa is address of the memory location to be programmed. 2. pd is data to be programmed at byte address. 3. /dq7 is the output of the complement of the data written to the device. 4. d out is the output of the data written to the device. 5. figure indicates last two bus cycles of four bus cycle sequence. figure 9. ac waveforms program operations
27 hy29f040a figure 10. ac waveforms chip/sector erase operations switching waveforms notes: 1. sa is the sector address for sector erase. address = x = dont care for chip erase. addresses 5555h 2aaah 5555h 5555h 2aaah sa ce oe we data v cc aah 55h 80h aah 55h 10h/30h t ghwl t wp t cs t wph t dh t ds t vcs t ah t as 5.0v gnd
28 hy29f040a switching waveforms figure 11. ac waveforms for /data polling during internal algorithm operations notes: 1. dq7 = valid data (the device has completed the internal program or erase operation.) t ch t oeh t ce t oe t whwh 1 or 2 dq7 dq0-dq6 dq7 dq7=valid data dq0-dq6=invalid dq0-dq7 valid data t oe t oh t df high z ce oe we 5.0v gnd data v cc
29 hy29f040a figure 12. ac waveforms for toggle bit during internal algorithm operations switching waveforms notes: 1. dq6 stops toggling (the device has completed the internal program or erase operation) t oeh t oes data (dq0-dq7) dq6 = toggle dq6 = toggle dq6 = stop toggling dq0-dq7 valid v cc t oe ce we oe 5.0v gnd data
30 hy29f040a figure 13. sector protection algorithm start set u p sector address (a18, a17, a16) plscnt = 1 /w e = v ih /c e = /o e = v il a9 rem ains at v id /c e = v il d ata = 01h ? address = sa a0 = v il , a1 = v ih , a6 = v il plscnt= 25 ? no yes power down a9 no d e vice f ailed yes protect another sector? yes a9 = v id /o e = v id a ctivate /w e p uls e time out 100 m s power down /oe read from sector s ec tor p ro tec t c om ple te implem ent plscn t no
31 hy29f040a switching waveforms t oe o1h sa x sa y a18 a17 a16 a0 a1 a6 t wpp1 we data t vlht 12v a9 t vlht t vlht oe ce t csp 12v v cc 5.0v gnd notes: 1. sa x = sector address for initial sector 2. sa y = sector address for next sector figure 14. ac waveforms for sector protection
32 hy29f040a figure 15. sector unprotect algorithm start protect all sectors plscnt = 1 /we = v ih /ce = /oe = v il a9 remains at v id /oe = v id data = 00h ? set up sector address = sa0 a0 = v il , a1 = v ih , a6 = v ih plscnt= 1000 ? no power down a9 no device failed yes sector address = sa7 ? a9 = v id /ce = v id activate /we pulse time out 10 ms read data from device sector unprotect complete increment sector address set up sector unprotect mode a6 = a12 = a16 = v ih yes increment plscnt no yes yes notes: 1. sa0 = sector address for initial sector 2. sa7 = sector address for the last sector
33 hy29f040a figure 16. ac waveforms for sector unprotect notes: 1. starts with sa0 and sequences to sa7. 2. see figure 15 for details. a9 sa0 a18 a17 a0 a1 12v a12 oe 12v we t wpp2 ce 12v t ce t vlht 00h data a16 sa0 a6 v cc t oesp 5.0v t vlht t vlht switching waveforms
34 hy29f040a ac characteristics write / erase / program operations alternate /ce controlled writes jedec standard description -55 -70 -90 -120 -150 unit t avav t wc write cycle time (1) min. 55 70 90 120 150 n s t avel t as address setup time min. 0 0 0 0 0 n s t elax t ah address hold time min. 40 45 45 50 50 n s t dveh t ds data setup time min. 25 30 45 50 50 n s t ehdx t dh data hold time min. 0 0 0 0 0 n s t oes output enable setup time min. 0 0 0 0 0 n s t oeh output read (1) min. 0 0 0 0 0 ns enable t oggle bit and min. 10 10 10 10 10 ns hold time /data polling (1) t ghel t ghel read recover time before write min. 0 0 0 0 0 ns t wlel t ws /we setup time min. 0 0 0 0 0 ns t ehwh t wh /we hold time min. 0 0 0 0 0 ns t eleh t cp /ce pulse width min. 30 35 45 50 50 ns t ehel t cph /ce pulse width high min. 20 20 20 20 20 ns t whwh1 t whwh1 byte programming operation typ. 7 7 7 7 7 m s max. 1.0 1.0 1.0 1.0 1.0 ms t whwh2 t whwh2 sector erase operation (2) typ. 1 1 1 1 1 sec max. 15 15 15 15 15 sec t whwh3 t whwh3 chip erase operation (2) typ. 8 8 8 8 8 sec max. 120 120 120 120 120 sec t vcs v cc set up time (1) min. 50 50 50 50 50 m s t vidr rise time to v id (1,2) min. 500 500 500 500 500 ns t cesp /oe setup time to /we active (1,2) min. 4 4 4 4 4 m s t vlht voltage transition time (1,2) min. 4 4 4 4 4 m s t wpp1 sector protect write pulse width (2) min. 100 100 100 100 100 m s t wpp2 sector unprotect write pulse width (2) min. 10 10 10 10 10 ms t csp /ce setup time to /we active (1,2) min. 4 4 4 4 4 ns parameter symbols notes: 1. not 100% tested. 2. these timings are for sector protect and/or sector unprotect operations.
35 hy29f040a switching waveforms data polling addresses 5555h pa pa t wc t as t ah we oe ce data v cc t ghel t cp t ws t cph aoh pd dq7 d out t ds t whwh1 t dh notes: 1. pa is address of the memory location to be programmed. 2. pd is data to be programmed at byte address. 3. dq7 is the output of the complement of the data written to the device. 4. d out is the output of the data written to the device. 5. figure indicates last two bus cycles of four bus cycle sequence. figure 17. alternate /ce controlled program operation timings
36 hy29f040a erase and programming performance parameter limits unit min. typ. max. sector erase time 1.0 15 sec chip erase time 8 120 sec byte programming time 7 1000 m s chip programming time 7 25 sec erase/program cycles 100,000 1,000,000 cycles latch up characteristics parameter min. max. input voltage with respect to vss on all i/o pins -1.0v vcc + 1.0v vcc current -100 ma + 100 ma notes: 1. includes all pins except vcc. test conditions: vcc = 5.0v, one pin at a time. pdip pin capacitance parameter symbol parameter description test setup typ. max. unit c in input capacitance v in = 0 4 6 pf c out output capacitance v out = 0 8 12 pf c in2 control pin capacitance v in = 0 8 12 pf notes: 1. sampled, not 100% tested. 2. test conditions ta = 25c, f = 1.0 mhz plcc pin capacitance parameter symbol parameter description test setup typ. max. unit c in input capacitance v in = 0 4 6 pf c out output capacitance v out = 0 8 12 pf c in2 control pin capacitance v in = 0 8 12 pf notes: 1. sampled, not 100% tested. 2. test conditions ta = 25c, f = 1.0 mhz tsop pin capacitance parameter symbol parameter description test setup typ. max. unit c in input capacitance v in = 0 6 7.5 pf c out output capacitance v out = 0 8.5 12 pf c in2 control pin capacitance v in = 0 7.5 9 pf notes: 1. sampled, not 100% tested. 2. test conditions ta = 25c, f = 1.0 mhz.
37 hy29f040a parameter t est conditions minimum unit minimum pattern data retention time 150 o c 10 years 125 o c 20 years data retention
38 hy29f040a package drawings - physical dimensions tsop32 32-pin standard thin small outline package (measured in millimeters) pdip32 32-pin plastic dip (measured in inches) 18.30 18.50 pin 1 i.d. 7.90 8.10 .015 .060 .0.18 .0.21 0.25mm (0.0098") bsc 1.20 max 1 17 32 19.80 20.20 .0.08 .0.20 0 5 o o 0.95 1.05 0.50 bsc 0.05 0.15 16 32 1.640 1.680 32 pin 1 i.d. 17 16 .530 .580 .005 min .045 .065 .015 .060 .014 .022 .090 .110 .120 .160 .040 .225 .140 .225 seating plane .630 .700 0 o 10 o .600 .625 .008 .015
39 hy29f040a package drawings - physical dimensions plcc32 32-pin plastic leaded chip carrier (measured in inches) .447 .453 top view .050 ref. .042 .056 pin 1 i.d . .485 .495 .547 .553 .585 .595 .026 .032 seating plane .490 .530 .009 .015 .080 .095 .125 .140 side view .013 .021 .400 ref
40 hy29f040a hy29f040a x C x x x special instructions temperature range blank = commercial (0 o c to +70 o c) i = industrial (C40 o c to +85 o c) e = extended (C55 o c to +125 o c) speed option see product selector guide and valid combinations package type p = 32-pin plastic dip (pdip) c = 32-pin rectangular plasteic leaded chip carrier (plcc) t = 32-pin thin small outline package (tsop) standard pinout r = 32-pin thin small outline package (tsop) reverse pinout device number/description hy29f040a 4 megabit (512k x 8-bit) cmos 5.0 volt-only. sector erase flash memory. valid combinations valid combinations list configurations planned to be supported in volume for this device. consult the local hyundai sales office to confirm availability of specific valid combinations and to check on newly released combinations. ordering information hyundai products are available in several packages and operating ranges. the order number (valid combination) is formed by a combination of the following: valid combinations p-55, c-55, t-55, r-55 p-55i, c-55i, t-55i, r-55i p-55e, c-55e, t-55e, r-55e p-70, c-70, t-70, r-70 p-70i, c-70i, t-70i, r-70i p-70e, c-70e, t-70e, r-70e p-90, c-90, t-90, r-90 p-90i, c-90i, t-90i, r-90i p-90e, c-90e, t-90e, r-90e p-12, c-12, t-12, r-12 p-12i, c-12i, t-12i, r-12i p-12e, c-12e, t-12e, r-12e p-15, c-15, t-15, r-15 p-15i, c-15i, t-15i, r-15i p-15e, c-15e, t-15e, r-15e 55ns 70ns 90ns 120ns 150ns

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